9781632383068 t fc

ISBN : 9781632383068

Publisher :   mlbooksinternational

Language :   English

Category :   Physics

Publication Year :   2015

Price : USD  110.00

Description :  This book on scanning electron microscopy examines the key concepts employed in the field. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical applications. It further includes numerous topics on geoscience, instrumentation, mineralogy, thin films, biology, ceramic and materials for electronic industry. This book includes contributions by renowned researchers and experts in this field.

Author/Editor :  Lisa Page

Author's Description :  Lisa Page heads a scanning electron microscopy laboratory in Germany. She is trained in electron microscopy and has worked on transmission electron microscopy and scanning electron microscopy for more than 14 years. She is actively engaged in the research work focused on x-ray microanalysis; and this work resulted in 7 journal papers that have been published worldwide. She has also authored and edited numerous articles, journal papers and books in the field of electron microscopy.